• Research professional
  • Université de Montréal
  • Chemistry
  • (514) 343-2498
  • patricia.moraille@umontreal.ca

Patricia Moraille

Areas of expertise

  • Nanosciences

Research expertise

  • The LCM scanning probe microscopy platform offers cutting-edge instrumental infrastructure as well as expertise for the characterization of physical, chemical and nanomechanical properties of nanostructured surfaces, by: AFM, STM, LFM, MFM, EFM, SECM, AFM-IR, SEM.